The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Dec. 10, 2015
Invis Corporation, San Jose, CA (US);
Gregory J. Kintz, Santa Cruz, CA (US);
Philip J. Stephanou, Mountain View, CA (US);
Kurt E. Petersen, Milpitas, CA (US);
Srinivasan K. Ganapathi, Palo Alto, CA (US);
John Batey, Incline Village, NV (US);
INVIS TECHNOLOGIES CORPORATION, Sunnyvale, CA (US);
Abstract
A gradient-index lens for focusing incident electromagnetic radiation comprises at least first and second substrates. Each of the substrates has a plurality of trenches or holes formed therein. The first substrate is stacked on the second substrate such that trenches or holes in the first substrate are substantially aligned with corresponding trenches or holes in the second substrate to form combined trenches or holes. Each of the combined trenches or holes has a width or diameter that is less than a wavelength of the electromagnetic radiation, and the spacing between adjacent ones of the combined trenches or holes is less than the wavelength of the electromagnetic radiation. The size and spacing of the combined trenches or holes in the stacked substrates are sufficient to produce an effective refractive index profile of the lens element that is graded. A method for producing the lens is also provided.