The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Nov. 30, 2010
Applicants:

Jean Rinkel, Grenoble, FR;

Andrea Brambilla, Veurey-Voroize, FR;

Jean-marc Dinten, Lyons, FR;

Florent Mougel, Civrieux, FR;

Inventors:

Jean Rinkel, Grenoble, FR;

Andrea Brambilla, Veurey-Voroize, FR;

Jean-Marc Dinten, Lyons, FR;

Florent Mougel, Civrieux, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/00 (2013.01); G01T 1/17 (2006.01);
U.S. Cl.
CPC ...
G01T 1/171 (2013.01);
Abstract

A method correcting a measured spectrum of X radiation, according to a number of channels Nc, each channel i corresponding to an energy range between Eand Ei+ΔE, including: determining function δt(k) determining size of temporal deviation Δt interval separating two interactions with energy Eand E, stacking of which leads to a detected energy value E; determining, from the function δt(k), probability function P(k) that an event counted in a channel k corresponds to a stack of two interactions, respectively of energies Eand E; determining, from the probability function P(k), a stack spectrum as a part of the measured spectrum that corresponds only to the stacks alone; and calculating or estimating at least a first corrected spectrum, by the difference between the measured spectrum and the stack spectrum.


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