The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
May. 27, 2011
Applicant:
Christopher Ryan Moon, Cupertino, CA (US);
Inventor:
Christopher Ryan Moon, Cupertino, CA (US);
Assignee:
Keysight Technologies, Inc., Santa Rosa, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/24 (2010.01); G01Q 10/06 (2010.01); B82Y 35/00 (2011.01); G01Q 60/36 (2010.01);
U.S. Cl.
CPC ...
G01Q 10/065 (2013.01); B82Y 35/00 (2013.01); G01Q 60/363 (2013.01);
Abstract
A method for optimizing loop gain of an atomic force microscope (AFM) apparatus includes determining a change in gain of the physical system and adjusting a controller frequency response of the controller in an AFM loop to compensate for the determined change in gain. The AFM loop has a corresponding loop response that includes the product of the controller frequency response and a physical system response of the physical system.