The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Aug. 09, 2013
Applicant:
National University Corporation Toyohashi University of Technology, Toyohashi-shi, Aichi, JP;
Inventors:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/403 (2006.01); G01N 27/416 (2006.01); H01L 29/40 (2006.01); H01L 29/73 (2006.01); H01L 29/423 (2006.01); H01L 29/735 (2006.01); H01L 29/10 (2006.01); H01L 29/861 (2006.01); H01L 27/06 (2006.01);
U.S. Cl.
CPC ...
G01N 27/4168 (2013.01); H01L 29/40 (2013.01); H01L 29/73 (2013.01); H01L 27/0664 (2013.01); H01L 29/1008 (2013.01); H01L 29/42304 (2013.01); H01L 29/735 (2013.01); H01L 29/8611 (2013.01);
Abstract
Provided is a small-sized device for measuring an oxidation-reduction potential, whereby an oxidation-reduction current and an oxidation-reduction potential can be measured by reducing noise even when a signal from a solution being measured is small. A device for measuring an oxidation-reduction potential is provided with a substrate (), a working electrode () mounted on a surface of the substrate (), and a bipolar transistor () for amplifying the output of the working electrode () also provided on the surface of the substrate (), and the signal amplified by the bipolar transistor () is inputted to a processing circuit ().