The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Oct. 25, 2012
Applicant:
Purdue Research Foundation, West Lafayette, IN (US);
Inventors:
James Michael Caruthers, Lafayette, IN (US);
Douglas E. Adams, Brentwood, TN (US);
Anand David, Woodbury, MN (US);
Peter R. O'Regan, West Lafayette, IN (US);
Farshid Sadeghi, West Lafayette, IN (US);
Nathan Daniel Sharp, West Lafayette, IN (US);
Mark David Suchomel, Sugar Grove, IL (US);
Assignee:
Purdue Research Foundation, West Lafayette, IN (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/72 (2006.01); H01M 10/04 (2006.01); H01M 10/0525 (2010.01); H01M 10/058 (2010.01); H01M 10/34 (2006.01);
U.S. Cl.
CPC ...
G01N 25/72 (2013.01); H01M 10/0413 (2013.01); H01M 10/0436 (2013.01); H01M 10/058 (2013.01); H01M 10/0525 (2013.01); H01M 10/345 (2013.01);
Abstract
Methods and apparatus for the detection of irregularities in a thin film by measurement of transient thermal response.