The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Jul. 01, 2014
Applicant:

Shanghai Jiao Tong University, Shanghai, CN;

Inventors:

Weiwen Zou, Shanghai, CN;

Shuo Yang, Shanghai, CN;

Xin Long, Shanghai, CN;

Jianping Chen, Shanghai, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/31 (2013.01); G01M 11/3109 (2013.01); G01M 11/3145 (2013.01); G01M 11/3154 (2013.01); G01M 11/3172 (2013.01);
Abstract

An optical pulse compression reflectometer is provided, which comprises: a single wavelength continuous optical source, an optical splitter, a modulation frequency pulse generating module, an optical directional coupler, an optical fiber under test, an optical coupler, a balanced photoelectric detector, and a pulse compression processing module. The present invention, in addition to overcoming the contradictory constraint between spatial resolution and measurement range in traditional time domain reflectometry and giving to full play the super spatial resolution from frequency modulation technology, has a longer measurement range than that in the optical frequency domain reflectometry.


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