The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Dec. 06, 2013
Applicant:

Endress + Hauser Gmbh + Co. KG, Maulburg, DE;

Inventors:

Benjamin Lemke, Berlin, DE;

Rafael Teipen, Berlin, DE;

Anh Tuan Tham, Berlin, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 19/06 (2006.01); G01L 13/02 (2006.01);
U.S. Cl.
CPC ...
G01L 13/025 (2013.01); G01L 19/0618 (2013.01);
Abstract

A pressure difference sensor includes a pressure difference measuring cell, which has a measuring cell platform with pressure contactable measuring chambers in its interior, a first mounting surface and a second mounting surface. The mounting surfaces have a variable separation under pressure loading of the measuring chambers. A first reinforcement element with a first planar reinforcement area and a second reinforcement element with a second planar reinforcement area. A deflection of the mounting surfaces due to a pressure loading of the measuring chambers is lessened by the reinforcement elements, wherein especially at least 50% of an effective stiffness K=1/(dx/dp) of the reinforcement elements connected by the pressure difference measuring cell is provided only by these connections of the reinforcement element with the measuring cell platform without additional connections between the reinforcement elements in a parallel branch, wherein x is the separation between the first mounting surface and the second mounting surface having the greatest pressure dependence dx/dp.


Find Patent Forward Citations

Loading…