The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Apr. 14, 2015
Raytheon Company, Waltham, MA (US);
Thomas William Ross, Jr., McKinney, TX (US);
Steven A. Miles, Plano, TX (US);
David C. Mann, Frisco, TX (US);
Marco A. Avila, McKinney, TX (US);
David Russell McDonald, Plano, TX (US);
Jeffery M. Gallagher, Princeton, TX (US);
RAYTHEON COMPANY, Waltham, MA (US);
Abstract
System and method for sensor alignment. In one example, a reimaging optical system includes reimaging foreoptics positioned to receive and reimage incident electromagnetic radiation to produce an intermediate image plane and output an optical beam of the received incident electromagnetic radiation, an imaging optical apparatus positioned to receive the optical beam and focus the electromagnetic radiation of the optical beam onto a first focal plane, a first imaging sensor positioned at the first focal plane and configured to produce a first image responsive to receiving the electromagnetic radiation of the optical beam, an alignment object selectively positioned at the intermediate image plane and configured to superimpose an alignment tool upon the first image, and a controller coupled to the first imaging sensor and configured to perform an alignment process for the first imaging sensor based on at least a position of the alignment tool in the first image.