The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Jan. 09, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Tetsuri Sonoda, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 11/25 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G01B 11/2513 (2013.01); G06T 7/521 (2017.01);
Abstract

A projection pattern as an image obtained by compositing the first two-dimensional pattern image and the second two-dimensional pattern image is projected onto an object, and the object onto which the projection pattern has been projected is captured. The three-dimensional shape information of the object is measured based on the projection pattern and the captured image. When a region formed from one or a plurality of pixels is set as the first unit area, and a region having a size larger than that of the first unit area is set as the second unit area, each first unit area of the first two-dimensional pattern image is assigned with one of a plurality of pixel values, and each second unit area of the second two-dimensional pattern image is assigned with one of the plurality of pixel values.


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