The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Dec. 02, 2013
Applicant:

Dmg Mori Seiki Co., Ltd., Yamatokoriyama-shi, Nara, JP;

Inventor:

Hideaki Tamiya, Isehara, JP;

Assignee:

DMG MORI SEIKI CO., LTD., Yamatokoriyama-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01D 5/347 (2006.01); G01D 5/38 (2006.01);
U.S. Cl.
CPC ...
G01B 11/00 (2013.01); G01D 5/34746 (2013.01); G01D 5/34792 (2013.01); G01D 5/38 (2013.01); G01D 5/34723 (2013.01);
Abstract

A scale has marks whose pitch interval changes along a measurement direction in a manner that can be approximated to a quadratic or higher-order polynomial. A comparing unit calculates a difference between first relative position information and second relative position information per unit displacement in a position where a first displacement detecting unit is arranged. Then, an absolute position computing unit computes an absolute position in the measurement direction with respect to the scale based on absolute position information and the relative position information of at least one of the first relative position information and the second relative position information, and outputs the absolute position.


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