The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Oct. 06, 2016
Fujifilm Corporation, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
A plurality of recording elements included in a printed head are grouped into a plurality of groups, a test order is set in units of groups, and a test of the recording elements is periodically performed in units of groups in the set test order. In a case where an abnormality is detected in the recording element as a result of the test, the recording element in which an abnormality is detected is recognized as a retest target, an order of tests is changed through interruption, and a retest of a group including the recording element recognized as a retest target is performed. In a case where an abnormality is detected again in the recording element that is a retest target as a result of the retest, the recording element that is a retest target is recognized as an abnormal recording element.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile