The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2017

Filed:

Dec. 01, 2014
Applicant:

Toppan Printing Co., Ltd., Taito-ku, JP;

Inventors:

Yasuhiro Sasaki, Taito-ku, JP;

Mitsuru Kano, Taito-ku, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/00 (2006.01); B05B 13/02 (2006.01); C23C 14/56 (2006.01); C23C 16/455 (2006.01); C23C 16/54 (2006.01); B65H 20/02 (2006.01);
U.S. Cl.
CPC ...
B05B 13/0221 (2013.01); C23C 14/562 (2013.01); C23C 16/45551 (2013.01); C23C 16/545 (2013.01); B65H 20/02 (2013.01); B65H 2301/51145 (2013.01);
Abstract

A rolled film formation apparatus including a first chamber in which a first precursor is applied to a substrate, a second chamber in which a second precursor is applied to the substrate such that the first and second precursors react with each other and that an atomic layer is deposited on the substrate, a third chamber in which a purge gas is applied to the substrate, and conveyance roller pairs which are positioned in the first, second and third chambers, and convey the substrate. Each conveyance roller pair includes a first roller and a second roller which sandwich the substrate in a thickness direction of the substrate. At least one of the first and second rollers has an outer peripheral surface having a surface unevenness. The substrate is moved back and forth among the first, second and third chambers. The atomic layer is deposited more than once on the substrate.


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