The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2017
Filed:
Jun. 15, 2012
Ha Hyun Lee, Seoul, KR;
Jung Won Kang, Daejeon-si, KR;
Jin Soo Choi, Daejeon-si, KR;
Jin Woong Kim, Daejeon-si, KR;
Dong Gyu Sim, Seoul, KR;
Hyo Min Choi, Seoul, KR;
Jung Hak Nam, Seoul, KR;
Ha Hyun Lee, Seoul, KR;
Jung Won Kang, Daejeon-si, KR;
Jin Soo Choi, Daejeon-si, KR;
Jin Woong Kim, Daejeon-si, KR;
Dong Gyu Sim, Seoul, KR;
Hyo Min Choi, Seoul, KR;
Jung Hak Nam, Seoul, KR;
Abstract
The present invention relates to a method and an apparatus for interlayer intra-prediction, and the method for interlayer intra-prediction, according to the present invention, comprises the steps of: deciding whether to apply an interlayer prediction to an enhancement layer; and performing a prediction on a current block of the enhancement layer based on reference information that is generalized and generated from a reference picture, which is decoded, of a reference layer, when the interlayer prediction is applied.