The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2017
Filed:
Mar. 13, 2012
Ole Jensen Bjarlin, Værløse, DK;
Peter Eskil Andersen, Tølløse, DK;
Paul Michael Petersen, Hillerød, DK;
André Müller, Roskilde, DK;
Ole Jensen Bjarlin, Værløse, DK;
Peter Eskil Andersen, Tølløse, DK;
Paul Michael Petersen, Hillerød, DK;
André Müller, Roskilde, DK;
DANMARKS TEKNISKE UNIVERSITET, KGS. Lyngby, DK;
Abstract
A method of controlling beam quality and stability of a laser apparatus, the laser apparatus comprising, a diode laser () providing first radiation of at least a first wavelength, and a frequency conversion unit () configured to frequency-convert the first radiation from the diode laser and to output the frequency-converted radiation (), the frequency-converted radiation having at least a second wavelength different from the first wavelength, the diode laser () comprising at least a first and a second section (), a first contact () for injecting a first current (I) into the first section (), a second contact () for injecting a second current (I) into the second section (), and means for controlling a temperature of the diode laser; wherein the method comprises monitoring a first parameter indicative of the power content of a dominant lobe of the first radiation; iteratively determining a combination of respective values of the first current, the second current and the temperature at which combination of respective values the monitored first parameter and a stability parameter indicative of a fluctuation over time of the monitored first parameter each fulfills a respective predetermined optimization criterion; and setting the first current, the second current, and the temperature to the determined combination of respective values.