The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2017

Filed:

Jul. 26, 2016
Applicant:

Rohm Co., Ltd., Kyoto, JP;

Inventors:

Tadahiro Morifuji, Kyoto, JP;

Shigeyuki Ueda, Kyoto, JP;

Assignee:

Rohm Co., Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 23/00 (2006.01); H01L 23/31 (2006.01);
U.S. Cl.
CPC ...
H01L 24/17 (2013.01); H01L 23/3128 (2013.01); H01L 23/3171 (2013.01); H01L 23/3192 (2013.01); H01L 23/562 (2013.01); H01L 24/03 (2013.01); H01L 24/05 (2013.01); H01L 24/11 (2013.01); H01L 24/12 (2013.01); H01L 24/13 (2013.01); H01L 24/16 (2013.01); H01L 24/81 (2013.01); H01L 2224/03912 (2013.01); H01L 2224/03914 (2013.01); H01L 2224/0401 (2013.01); H01L 2224/05014 (2013.01); H01L 2224/05027 (2013.01); H01L 2224/0569 (2013.01); H01L 2224/05541 (2013.01); H01L 2224/05555 (2013.01); H01L 2224/05557 (2013.01); H01L 2224/05583 (2013.01); H01L 2224/10122 (2013.01); H01L 2224/1147 (2013.01); H01L 2224/11902 (2013.01); H01L 2224/13006 (2013.01); H01L 2224/1308 (2013.01); H01L 2224/13023 (2013.01); H01L 2224/13099 (2013.01); H01L 2224/16 (2013.01); H01L 2224/8121 (2013.01); H01L 2224/81815 (2013.01); H01L 2924/01004 (2013.01); H01L 2924/014 (2013.01); H01L 2924/0105 (2013.01); H01L 2924/01006 (2013.01); H01L 2924/01013 (2013.01); H01L 2924/01014 (2013.01); H01L 2924/01015 (2013.01); H01L 2924/01022 (2013.01); H01L 2924/01029 (2013.01); H01L 2924/01033 (2013.01); H01L 2924/01073 (2013.01); H01L 2924/01078 (2013.01); H01L 2924/01079 (2013.01); H01L 2924/01082 (2013.01); H01L 2924/05042 (2013.01); H01L 2924/14 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/181 (2013.01); H01L 2924/351 (2013.01); H01L 2924/3512 (2013.01);
Abstract

Disclosed is a semiconductor device suppressed in decrease of reliability. The semiconductor device comprises an electrode pad portion () formed on the upper surface of a semiconductor substrate (), a passivation layer () so formed on the upper surface of the semiconductor substrate () as to overlap a part of the electrode pad portion () and having a first opening portion () where the upper surface of the electrode pad portion () is exposed, a barrier metal layer () formed on the electrode pad portion (), and a solder bump () formed on the barrier metal layer (). The barrier metal layer () is formed such that an outer peripheral end () lies within the first opening portion () of the passivation layer () when viewed in plan.


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