The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9685019 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 20, 2017

Filed:

Dec. 10, 2013
Applicant:

Giesecke & Devrient Gmbh, Munich, DE;

Inventors:

Christoph Mengel, Holzkirchen, DE;

Alexander Bornschlegl, Munich, DE;

Peter Schiffmann, Munich, DE;

Jurgen Schutzmann, Pfaffenhofen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G07D 7/04 (2016.01); G07D 7/12 (2016.01);
U.S. Cl.
CPC ...
G07D 7/04 (2013.01); G07D 7/12 (2013.01); G07D 7/124 (2013.01);
Abstract

A method or apparatus for examining a security element of a value document involves at least one optical property of the security element influenceable by a magnetic field. The value document is transported through a magnetic field which is inhomogeneous transversely to the transport direction and/or is changed time-dependently. An image of at least one portion of the value document having the security element is captured and image data describing the image are formed. The optical properties of the security element are influenced by the magnetic field, and the image data is checked whether they have a location dependence transverse to the transport direction corresponding to the location dependence of the magnetic field and/or have a location dependence in the transport direction corresponding to the time dependence of the magnetic field.


Find Patent Forward Citations

Mengel, Christoph. (2017). Device for examining a value document and method for examining a value document (U.S. Patent No. 9685019). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9685019

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