The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2017

Filed:

Sep. 01, 2015
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Ti-chiun Chang, Princeton Junction, NJ (US);

Xiaoguang Lu, West Windsor, NJ (US);

Peter Speier, Erlangen, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); G06T 7/00 (2017.01); G06K 9/52 (2006.01); G06T 5/20 (2006.01); G01R 33/56 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); G01R 33/5608 (2013.01); G06K 9/522 (2013.01); G06T 5/20 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10088 (2013.01);
Abstract

A computer-implemented method for performing isotropic reconstruction of Magnetic Resonance Imaging (MRI) data includes receiving a stack of slices acquired by an MRI device in two or more directions and reslicing the stack of slices into (i) an acquired view stack comprising high-resolution slices acquired in-plane, and (ii) a reslice stack comprising degraded slices acquired out of plane. An estimated slice profile is generated based on the stack of slices and the acquired view stack is convolved with the estimated slice profile to yield a simulated distorted slice stack. The simulated distorted slice stack is subtracted from the acquired view stack to yield a high-frequency band estimate and the high-frequency band estimate is combined with the reslice stack to yield isotropic reconstruction results.


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