The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2017

Filed:

Jun. 29, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Pietro Ferrara, White Plains, NY (US);

Marco Pistoia, Amawalk, NY (US);

Omer Tripp, Bronx, NY (US);

Petar I. Tsankov, Zurich, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/56 (2013.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
G06F 21/566 (2013.01); H04L 63/20 (2013.01);
Abstract

A method is provided to instrument applications with an instrumentation policy that is visually configurable and allows for run-time modifications of the policy. Instrumentation is achieved without modifying the source code of the applications. Modification of the instrumentation policy of an application is applied without re-compiling, re-deploying, and re-provisioning the application. The instrumentation tracks the flow of values at run time throughout the execution of an application and fixes any security violation automatically by dynamically modifying any value that violates integrity or confidentiality.


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