The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2017

Filed:

Jun. 18, 2010
Applicants:

Navid Azizi, Markham, CA;

Joshua David Fender, East York, CA;

Ryan Fung, Mississauga, CA;

Inventors:

Navid Azizi, Markham, CA;

Joshua David Fender, East York, CA;

Ryan Fung, Mississauga, CA;

Assignee:

Altera Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01);
Abstract

A method for performing timing analysis on calibrated paths includes performing static timing analysis on the calibrated paths to obtain delay and margin information. The delay and margin information are utilized to emulate operations performed during calibration.


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