The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2017
Filed:
Jul. 10, 2014
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Jian dong Ding, Shanghai, CN;
Ning Duan, Beijing, CN;
Guoqiang Hu, Shanghai, CN;
Sheng Huang, Shanghai, CN;
Jun Zhu, Shanghai, CN;
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 11/36 (2006.01); G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30979 (2013.01); G06F 11/263 (2013.01); G06F 11/36 (2013.01); G06F 17/30424 (2013.01); G06F 17/30657 (2013.01); G06F 17/30929 (2013.01);
Abstract
Embodiments of the present invention provide information processing systems and methods for proliferating testing data based on sample testing data. In one embodiment, a difference is determined by comparing a desired query result to a query result acquired by executing a query statement on sample testing data. Sample testing data can then be proliferated based, at least in part, on the difference and data generation constraint conditions.