The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2017
Filed:
Jun. 25, 2014
International Business Machines Corporation, Armonk, NY (US);
Wei S. Dong, Beijing, CN;
Chunhua Tian, Beijing, CN;
Yu Wang, Beijing, CN;
Yu Wang, Shanghai, CN;
Junchi Yan, Shanghai, CN;
Chao Zhang, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
In an approach for evaluating a predictive model, a computer identifies features of training samples in a set of training samples and selects at least one evaluation metric from a set of evaluation metrics as one or more available metrics based on the identified features. The computer applies a predictive model created based on the set of training samples to a set of test samples so as to calculate values of the one or more available metrics and evaluates the predictive model by using the one or more available metrics and the values of the available metrics. With the technical solutions described with respect to the embodiments of the present invention, one or more evaluation metrics that are applicable to specific training sample features may be determined from several evaluation metrics, so that users can precisely evaluate predictive models by using the determined evaluation metrics.