The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2017

Filed:

Sep. 16, 2015
Applicant:

Here Global B.v., Veldhoven, NL;

Inventors:

Gavril Giurgiu, Chicago, IL (US);

Dongwook Jang, Lisle, IL (US);

Joshua Thompson, Chicago, IL (US);

Assignee:

HERE Global B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/20 (2006.01); G01C 21/28 (2006.01); G01C 21/30 (2006.01); G01C 21/32 (2006.01); G01C 21/00 (2006.01); G01S 19/07 (2010.01); G01S 19/40 (2010.01); G01S 19/41 (2010.01); G01S 19/42 (2010.01); G01S 19/49 (2010.01);
U.S. Cl.
CPC ...
G01S 19/41 (2013.01); G01C 21/005 (2013.01); G01C 21/20 (2013.01); G01C 21/28 (2013.01); G01C 21/30 (2013.01); G01C 21/32 (2013.01); G01S 19/07 (2013.01); G01S 19/40 (2013.01); G01S 19/42 (2013.01); G01S 19/49 (2013.01);
Abstract

An approach is provided for generating location data error maps. The approach involves determining location data error information associated with at least one set of location data. The approach also involves causing, at least in part, an encoding of the location data error information as a function of a position parameter. The approach further involves causing, at least in part, a generation of at least one location data error map based, at least in part, on the encoding.


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