The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2017
Filed:
Jul. 16, 2015
Christian Simard, Quebec, CA;
Benjamin Couillard, Quebec, CA;
Christian Simard, Quebec, CA;
Benjamin Couillard, Quebec, CA;
Olympus Scientific Solutions Americas Inc., Waltham, MA (US);
Abstract
A non-destructive testing and inspection (NDT/NDI) system and method operable to conduct an ultrasonic scanning test on a test object that synchronizes and merges the apertures of two or more NDT sub-instruments in frequency and phase. Disclosed are a method of using a Phased Lock Loop (PLL) as a synchronizing clock/trigger generator, and also a method of using a General Positioning Clock (GPS) and a pulse per second (PPS) output. Both methods combine ultrasonic scanning data acquisition from two or more NDT sub-instruments, and transform the sub-instruments into one bigger NDT instrument.