The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2017

Filed:

Jan. 27, 2014
Applicant:

Sreeram Dhurjaty, Rochester, NY (US);

Inventor:

Sreeram Dhurjaty, Rochester, NY (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/416 (2006.01); G01R 31/00 (2006.01); G01N 29/04 (2006.01); G01N 27/02 (2006.01); G01N 33/15 (2006.01);
U.S. Cl.
CPC ...
G01N 27/026 (2013.01); G01N 33/15 (2013.01);
Abstract

A material signature detector that provides for the assessment of changes in critical material properties of materials such as pharmaceuticals and solutions is disclosed. The material signature detector is non-contact and non-invasive and provides the ability to detect unintended changes in the contents of a vial or other container during the fill-finish process, transport, compounding, or storage. The material signature detector uses a novel resonant electrical impulse spectroscopy circuit that employs quadrature demodulation at lower frequencies to detect changes in the capacitance and conductance (resistance) of the sample under test. A series of digital signatures are created at different frequencies to provide an overall assessment of changes in the properties of the material under test. These digital signatures may in turn be stored in an electronic library for subsequent analytics.


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