The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2017
Filed:
Dec. 08, 2014
Ted Michael Shields, Arlington, MA (US);
Michael Drummy, Reading, MA (US);
David Joyce, Chelmsford, MA (US);
Matthew Thomas Susa, Ashburnham, MA (US);
Ted Michael Shields, Arlington, MA (US);
Michael Drummy, Reading, MA (US);
David Joyce, Chelmsford, MA (US);
Matthew Thomas Susa, Ashburnham, MA (US);
Olympus Scientific Solutions Americas Inc., Waltham, MA (US);
Abstract
Disclosed is a test stand that supports and stabilizes a handheld XRF analyzer, and holds a body of sample to be tested. The test stand allows both horizontal and vertical analysis positions of the analyzer. The preferred embodiment of the test stand comprises a shielded X-ray chamber in which samples are tested and which affixes to the XRF analyzer's window via a spring loaded handle, a stabilizing base to which the analyzer's handle is situated, and a stanchion for horizontal mounting of the XRF analyzer. In the horizontal orientation, the chamber contains an adjustable platform and soil sample retainer to facilitate the positioning of the sample to be tested. The stanchion can be stored under the base.