The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2017
Filed:
Nov. 01, 2013
General Electric Company, Schenectady, NY (US);
Hewei Gao, Waukesha, WI (US);
Girijesh K. Yadava, Waukesha, WI (US);
Adam Israel Cohen, Milwaukee, WI (US);
Brian Edward Nett, Wauwatosa, WI (US);
GENERAL ELECTRIC COMPANY, Niskayuna, NY (US);
Abstract
Systems and methods for iterative multi-material correction are provided. A system includes an imager that acquires projection data of an object. A reconstructor reconstructs the acquired projection data into a reconstructed image, utilizes the reconstructed image to perform a multi-material correction on the acquired projection data to generate a multi-material corrected reconstructed image, and utilizes the multi-material corrected reconstructed image to perform one or more iterations of the multi-material correction on the projection data to generate an iteratively corrected multi-material corrected image.