The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2017

Filed:

Jun. 25, 2015
Applicant:

Azbil Corporation, Tokyo, JP;

Inventors:

Tomoki Hosoi, Tokyo, JP;

Daisuke Obara, Tokyo, JP;

Masashi Furuya, Tokyo, JP;

Seiichirou Kinugasa, Tokyo, JP;

Assignee:

AZBIL CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 15/14 (2006.01); G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6486 (2013.01); G01J 1/42 (2013.01); G01N 15/14 (2013.01); G01N 2015/1402 (2013.01); G01N 2015/1477 (2013.01); G01N 2015/1488 (2013.01);
Abstract

A particle detecting device includes: a light measuring instrument that measures measured values for intensities of first, second, and third lights of mutually differing wavelengths, produced by particles to be measured; a boundary information storing portion that stores a non-linear discriminating boundary for separating a class of a first classification of particles and a class of a second classification of particles; and a particle classifying portion that classifies the particle being measured into either of the classifications for the first and second classifications of particles, based on measured values for the intensities of the first through third lights and on the discriminating boundary.


Find Patent Forward Citations

Loading…