The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2017

Filed:

Nov. 20, 2013
Applicant:

Hexagon Technology Center Gmbh, Heerbrugg, CH;

Inventors:

Bo Pettersson, Luxembourg, LU;

Knut Siercks, Mörschwil, CH;

Benedikt Zebhauser, Rorschach, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/008 (2006.01); G01B 21/04 (2006.01); G05B 19/401 (2006.01);
U.S. Cl.
CPC ...
G01B 5/008 (2013.01); G01B 21/04 (2013.01); G05B 19/401 (2013.01); G05B 2219/37193 (2013.01); G05B 2219/37443 (2013.01); Y02P 90/265 (2015.11);
Abstract

The invention relates to a measuring machine and a method for automated measurement of an object and detection of differences between a feature of the object and CAD data of the object. The measuring machine comprises a probe head, a probe system comprising a probe and measurement functionality for determining three-dimensional coordinates of a feature of the object, a local computer terminal, an assigned memory unit, and an assigned set of measurement software programs for controlling the measuring machine. The stored CAD data of the object comprise typical dimensions and tolerances of the features, and the assigned set of measurement software programs comprises an optimization algorithm for the measurement of each feature which algorithm is designed to automatically select measuring parameters of the measuring machine and/or a measurement software program from the set of measurement software programs.


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