The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2017

Filed:

Nov. 16, 2016
Applicant:

Daifuku Co., Ltd., Osaka-shi, JP;

Inventors:

Junichi Sakamoto, Hinocho, JP;

Hideo Yoshioka, Hinocho, JE;

Assignee:

Daifuku Co., Ltd., Osaka-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); B65G 1/04 (2006.01); B65G 1/06 (2006.01);
U.S. Cl.
CPC ...
B65G 1/045 (2013.01); B65G 1/06 (2013.01); B65G 2201/0297 (2013.01);
Abstract

An article transport facility comprises storage sections, a transport device, a controller, and a learning module. The transport device has a transfer device having a support portion, and a light-emitter-receiver. The controller is caused to store information that indicates a second target position at which the transfer device is located when transferring an article, and information that indicates a first target position to which the support portion is moved. Each of a plurality of storage sections is provided with a reflector. A learning control performed by the controller is a control in which a first target position and a second target position are learned based on information of an image of the reflector captured by the imaging device of the learning module and pre-learning position information. Each reflector has a first area which forms the periphery of the reflector, and a second area in the first area. The relationship between the reflectance and the wave length of the reflected light is different between the first area and the second area.


Find Patent Forward Citations

Loading…