The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2017

Filed:

Mar. 24, 2015
Applicant:

Wasatch Microfluidics, Inc., Salt Lake City, UT (US);

Inventors:

Joshua W. Eckman, Salt Lake City, UT (US);

Adam Miles, Salt Lake City, UT (US);

James Smith, Bountiful, UT (US);

Christopher Morrow, Salt Lake City, UT (US);

Bruce K. Gale, Salt Lake City, UT (US);

Assignee:

CARTERRA, INC., Salt Lake City, UT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05C 5/02 (2006.01); B05C 11/10 (2006.01); B01L 3/02 (2006.01);
U.S. Cl.
CPC ...
B05C 11/1034 (2013.01); B01L 3/0262 (2013.01); B05C 5/027 (2013.01); B05C 5/0287 (2013.01); B05C 11/1005 (2013.01); B05C 11/1015 (2013.01); B01L 2200/0689 (2013.01); B01L 2200/141 (2013.01); B01L 2200/143 (2013.01); B01L 2300/023 (2013.01); B01L 2300/0636 (2013.01); B01L 2300/0822 (2013.01); B01L 2400/049 (2013.01); B01L 2400/0487 (2013.01);
Abstract

A system for depositing substances onto a deposition surface can comprise a first contact spotter comprising multiple spotting orifices fed by multiple fluid inlet conduits such that the first contact spotter is capable of depositing multiple spots of different substances onto the deposition surface simultaneously, and a second contact spotter comprising a second spotting orifice fed by a second fluid inlet conduit. The system can also include a positioning device adapted to alternatively position and seal the first contact spotter and second contact spotter on the deposition surface at an overlapping location.


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