The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2017
Filed:
Feb. 19, 2013
Keio University, Tokyo, JP;
Icst Corporation, Saitama-shi, Saitama, JP;
Koichi Wajima, Tokyo, JP;
Hitoshi Sato, Tokyo, JP;
Hironori Saisu, Tokyo, JP;
Wataru Muraoka, Tokyo, JP;
Taneaki Nakagawa, Tokyo, JP;
Yasunori Kato, Saitama, JP;
Keio University, Tokyo, JP;
ICST Corporation, Saitama, JP;
Abstract
An object of the present invention is to provide a system for performing objective examination of central sensitization, in particular, a system for objectively determining the presence or absence of central sensitization in a chronic pain patient. The present invention provides a device for diagnosing the presence or absence of central sensitization, the device including: stimulation output means for outputting thermal stimulation which can be perceived by a subject; first input means capable of inputting a measurement start signal; second input means capable of inputting a measurement end signal; and measurement control means for measuring time between an input signal from the first input means and an input signal from the second input means. The measurement control means determines that the central sensitization is present when the time between the input signal from the first input means and the input signal from the second input means is longer than t seconds (where t represents 30 seconds or more and less than 90 seconds).