The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2017

Filed:

Jun. 23, 2014
Applicant:

Glucovista, Inc., Fairfield, NJ (US);

Inventors:

Yonatan Gerlitz, Herzliya, IL;

Meir Shitrit, Talpiot Jerusalem, IL;

Assignee:

GlucoVista Inc., Fairfield, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/1455 (2006.01); A61B 5/1491 (2006.01); A61B 5/01 (2006.01); A61F 7/10 (2006.01); A61B 5/145 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1491 (2013.01); A61B 5/01 (2013.01); A61B 5/1455 (2013.01); A61B 5/14532 (2013.01); A61B 5/14546 (2013.01); A61F 7/10 (2013.01);
Abstract

A measurement apparatus includes a cooling device including two separated, different substances exhibiting an endothermic reaction when combined to decrease a temperature of the cooling device and a contacting mechanism to contact an assay surface with the cooling device. The apparatus includes a temperature measurement device to measure a temperature of the assay surface and an infrared radiation detector to measure infrared radiation emitted or absorbed. A data processor is configured to determine a concentration of a substance in the subject's body using the measured temperature and the infrared radiation. A measurement method includes using the cooling device and decreasing a temperature of the assay surface to a lower temperature, then measuring a temperature of the assay surface during an increase of the temperature. An infrared radiation detector measures infrared radiation emitted from or absorbed by the assay surface during the temperature increase from the lower temperature.


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