The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Aug. 05, 2015
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventors:

Frank Moesle, Stuttgart, DE;

Hans-Georg Drotleff, Rutesheim, DE;

Marc Geese, Gerlingen, DE;

Ulrich Seger, Leonberg-Warmbronn, DE;

Uwe Beutnagel-Buchner, Stuttgart, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); G01R 31/26 (2014.01); H04N 9/07 (2006.01); G03B 43/00 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); G01R 31/2639 (2013.01); G01R 31/2641 (2013.01); H04N 9/07 (2013.01); G03B 43/00 (2013.01);
Abstract

In a method for testing an image sensor having (i) regular pixels and test pixels, of which each is interconnected with one of two predefined voltage values, and (ii) a signal processing unit for providing digital signal values for output voltages of the pixels and test pixels, the following steps are performed: receiving digital signal values of the test pixels; and using the signal values of at least one proper or improper subset of the test pixels for testing the image sensor, all test pixels of the subset being interconnected with a first of the two voltage values. Using the test pixels for testing allows testing during ongoing operation, i.e., during reception of regular image signals.


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