The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Aug. 17, 2016
Applicant:

Multiphy Ltd., Ness-Ziona, IL;

Inventors:

Anthony Eugene Zortea, Pipersville, PA (US);

Russell Romano, Allentown, PA (US);

Assignee:

MULTIPHY LTD., Ness-Ziona, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 1/66 (2006.01); H04B 1/00 (2006.01); H04B 17/11 (2015.01);
U.S. Cl.
CPC ...
H03M 1/1033 (2013.01); H03M 1/662 (2013.01); H04B 1/0028 (2013.01); H04B 17/11 (2015.01);
Abstract

System and method for the calibration of interleave time errors in an n-level PAM Digital to Analog Converter (DAC), according to which a set of two samplers with adjustable sample time and threshold are introduced at the output of the DAC, which are separated in time. The set of samplers is swept through a n unit interval (UI) window and the n-UI window is classified to periods of transitions and non-transitions on an eye diagram. The relative timing of the lower rate clocks into an n:1 multiplexer is controlled using a control loop, to force equal eye width within the n-UI window and the interleaved timing errors are measured and corrected, until the uneven distribution is being reduced below a predetermined level.


Find Patent Forward Citations

Loading…