The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2017
Filed:
Sep. 02, 2015
Metaio Gmbh, Munich, DE;
Lorenz Kern, Munich, DE;
Norbert Stoeffler, Graefelfing, DE;
Apple Inc., Cupertino, CA (US);
Abstract
An apparatus for detecting a feature in an image includes an image input section for receiving at least part of the image in the form of image data having a plurality of pixels, the plurality of pixels comprising a plurality of non-border pixels, a feature detection module adapted to attribute a feature probability value to each of the pixels of the image data, and an extremum determination module for determining at least one local extremum among the feature probability values, wherein the extremum determination module is adapted to output, for each of the plurality of pixels, a final indication if the feature probability value of the pixel in question is a local extremum. The extremum determination module is adapted to use, for each of the plurality of non-border pixels, comparison results of at least two comparison operations, with each comparison operation including a comparison of the feature probability value of the non-border pixel in question with the feature probability values of a respective subset of neighboring pixels, with the respective subsets of neighboring pixels being different subsets.