The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2017
Filed:
May. 21, 2013
Applicant:
Nec Corporation, Tokyo, JP;
Inventor:
Ryota Mase, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06K 9/52 (2006.01); G06T 3/00 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6202 (2013.01); G06K 9/46 (2013.01); G06K 9/52 (2013.01); G06K 9/6211 (2013.01); G06T 3/00 (2013.01); G06T 5/006 (2013.01); G06K 9/4671 (2013.01); G06K 2009/4666 (2013.01); G06K 2009/6213 (2013.01);
Abstract
An input image showing a same object as an object shown in a reference image is identified more accurately. A difference area in the input image is determined by converting a difference area in the reference image, on a basis of geometric transformation information calculated by an analysis using a local descriptor. By matching a descriptor extracted from the difference area in the input image with the difference area in the reference image, fine differences that cannot be identified by conventional matching using only a local descriptor can be distinguished and images showing a same object can be exclusively identified.