The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Jun. 05, 2015
Applicants:

Chao Chen, Beijing, CN;

Yaojie LU, Beijing, CN;

Zhongchao Shi, Beijing, CN;

Dianchao Liu, Beijing, CN;

Inventors:

Chao Chen, Beijing, CN;

Yaojie Lu, Beijing, CN;

Zhongchao Shi, Beijing, CN;

Dianchao Liu, Beijing, CN;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00805 (2013.01); G06K 2209/21 (2013.01);
Abstract

A method and a system for analyzing a target in a stereo image by displaying the stereo image using a cascade structure are disclosed. The method includes for the input stereo image, generating, based on a first relevant feature, rule or model of the stereo image, at least a first first-level structure map, each of the first first-level structure maps being generated based on an individual tolerance level of the first relevant feature, rule or model, and each of the first first-level structure maps including the target at an individual first division level; and at least partly integrating the first first-level structure maps and analyzing the target in the stereo image, to obtain a structure map of a first-level target analysis result including the target.


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