The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2017
Filed:
Oct. 27, 2014
Applicant:
Amazon Technologies, Inc., Seattle, WA (US);
Inventor:
Faizaan Kersi Marolia, Bangalore, IN;
Assignee:
Amazon Technologies, Inc., Seattle, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 17/50 (2006.01); G06F 3/01 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01); G06F 3/01 (2013.01); G06F 11/3688 (2013.01); G06F 11/3692 (2013.01);
Abstract
A testing service is used to test the operation of a program. The testing service systematically explores the display screens generated by the program. The testing service also identifies the elements that are displayed on the screen and programmatically interacts with the elements. Test data including performance metrics and screen captures may be recorded during the testing. Test results associated with the testing of the program are provided to an authorized user.
Marolia, Faizaan. (2017). Systematically exploring programs during testing (U.S. Patent No. 9679090). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9679090
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile