The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Aug. 26, 2014
Applicant:

Trimble Ab, Danderyd, SE;

Inventors:

Jorge Hernandez Londono, Versailles, FR;

Thomas Chaperon, Arcueil, FR;

Guillaume Tremblay, Neuilly Plaisance, FR;

Assignee:

Trimble AB, Danderyd, SE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06T 15/10 (2011.01);
U.S. Cl.
CPC ...
G06F 17/3007 (2013.01); G06F 17/3028 (2013.01); G06F 17/30091 (2013.01); G06F 17/30126 (2013.01); G06F 17/30153 (2013.01); G06T 15/10 (2013.01); G06T 2215/16 (2013.01);
Abstract

Methods and apparatus are provided for processing data representing three-dimensional points organized in a data structure wherein each point has multiple components, the data is organized in a respective layer per component, each layer is segmented in cells of a two-dimensional grid, the cells are arranged such that the components of a given point are contained in corresponding cells of multiple layers, the cells are grouped in patches by layer, and the patches are arranged such that the components of an array of points is represented by corresponding patches of multiple layers. At least one first criterion and at least one second criterion are obtained. Data are retrieved from cells of patches meeting the at least one first criterion and from layers meeting the at least one second criterion. The retrieved data are processed to obtain a derivative data set.


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