The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2017
Filed:
Oct. 20, 2011
Hideaki Suzuki, Hitachi, JP;
Kozo Nakamura, Hitachiota, JP;
Shinya Yuda, Hitachi, JP;
Hiroki Uchiyama, Kawasaki, JP;
Hideaki Suzuki, Hitachi, JP;
Kozo Nakamura, Hitachiota, JP;
Shinya Yuda, Hitachi, JP;
Hiroki Uchiyama, Kawasaki, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
An object of the present invention is to provide an abnormality diagnostic system that can enhance diagnostic precision even if a computer arranged on the machine side does not have sufficient throughput in diagnosing a condition of a machine or equipment based upon time series data generated by a sensor and can reduce communication capacity because communication data volume decreases and industrial machinery provided with the abnormality diagnostic system. A diagnostic device on the machine sidediagnoses time series data generated by a sensor, acquires a primary diagnostic result, extracts time series data related to the primary diagnostic result and outputs it to a diagnostic device on the server sidetogether with the primary diagnostic result, the diagnostic device on the server sidediagnoses the time series data, acquires a secondary diagnostic result, and displays the secondary diagnostic result together with the primary diagnostic result. Besides, the diagnostic device on the server side compares the diagnostic results and updates a diagnostic process of the diagnostic device on the machine sidewhen the diagnostic results are different as a result of the comparison.