The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Mar. 21, 2013
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Radu Rugina, Sunnyvale, CA (US);

Vivek Mohan Thampi, Sunnyvale, CA (US);

Ricardo E. Gonzalez, Portola Valley, CA (US);

Alok Kataria, Sunnyvale, CA (US);

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0712 (2013.01); G06F 11/0793 (2013.01); G06F 11/3644 (2013.01); G06F 11/36 (2013.01);
Abstract

Probes are employed to inject errors into code. In response to a function-entry trigger event, a probe writes a predefined test value to a return value register. The probe then cause function execution to be skipped such that the test value is returned in lieu of the value which would otherwise be returned by the function. Behavior after the error is injected may then be observed, data collected, etc. such that undesired behavior (e.g., crashes) can be identified and/or corrected. In an alternative embodiment, the probe which is triggered may write a test value to a given memory address.


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