The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Mar. 26, 2014
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Shiori Oshima, Kanagawa, JP;

Suguru Dowaki, Kanagawa, JP;

Eriko Matsui, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/571 (2017.01); G02B 21/36 (2006.01); G06K 9/00 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/367 (2013.01); G06K 9/00134 (2013.01); G06T 7/571 (2017.01); G06T 7/74 (2017.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01);
Abstract

An analysis apparatus includes a two-dimensional coordinate detecting unit and a three-dimensional coordinate determining unit. The two-dimensional coordinate detecting unit is configured to detect, with respect to a captured image group obtained by capturing an analysis specimen including an analysis target object at a plurality of focal depths, a two-dimensional coordinate candidate being a candidate of a plane coordinate of the analysis target object in each captured image. The three-dimensional coordinate determining unit is configured to determine, based on a position relationship of the plane coordinate candidates between the captured images, a three-dimensional coordinate candidate being a candidate of a three-dimensional coordinate of the analysis target object.


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