The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Jul. 02, 2013
Applicant:

Nikon Corporation, Tokyo, JP;

Inventor:

Yuki Yoshida, Yokohama, JP;

Assignee:

NIKON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/12 (2006.01); G02B 27/00 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/125 (2013.01); G02B 21/367 (2013.01); G02B 27/0075 (2013.01);
Abstract

The present microscope system has: a microscope, which has a light source, an aperture stop, a condenser lens, and an objective lens; a camera, which has a microlens array and an image pickup element; and an image processing unit, which constitutes a computer. The image processing unit divides a plurality of pixels allocated to each of the microlenses into bright-field image detection regions to be used for detecting bright-field images, and dark-field image detection regions to be used for detecting darkfield images, in accordance with the size of an aperture of the aperture stop. The image processing unit generates bright-field image data of a sample and darkfield image data of the sample.


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