The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Feb. 28, 2014
Applicant:

Honeywell International Inc., Morristown, NJ (US);

Inventors:

Joseph E. Scheitlin, Plymouth, MN (US);

Mats Anders Brenner, Plymouth, MN (US);

Kim A. Class, Andover, MN (US);

Randy J. Reuter, Brooklyn Park, MN (US);

Bruce G. Johnson, Shoreview, MN (US);

John M. Howard, St. Paul, MN (US);

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/07 (2010.01); G01S 19/20 (2010.01); G01S 19/08 (2010.01);
U.S. Cl.
CPC ...
G01S 19/20 (2013.01); G01S 19/07 (2013.01); G01S 19/08 (2013.01);
Abstract

A method of implementing a real-time screening process for amplitude scintillation is presented. The method includes detecting an amplitude scintillation event during a sample time period at an amplitude scintillation monitor; excluding associated satellite measurement data from further use based on the detection of the amplitude scintillation event at the amplitude scintillation monitor; detecting an end to the amplitude scintillation event at the amplitude scintillation monitor; and readmitting associated satellite measurement data collected after the end of the amplitude scintillation event as determined by the amplitude scintillation monitor.


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