The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9678186 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 13, 2017

Filed:

Jan. 31, 2013
Applicant:

The United States of America As Represented BY the Secretary of the Army, Washington, DC (US);

Inventors:

Dimitri Arthur Alexson, Fairfax, VA (US);

Doran Dakota Smith, Rockville, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/46 (2006.01); G01Q 60/52 (2010.01); G01N 24/08 (2006.01); G01R 33/32 (2006.01); G01R 33/34 (2006.01);
U.S. Cl.
CPC ...
G01R 33/46 (2013.01); G01N 24/08 (2013.01); G01Q 60/52 (2013.01); G01R 33/323 (2013.01); G01R 33/34053 (2013.01);
Abstract

A probe for use in Magnetic Resonance Force Microscopy (MRFM) to provide an image of a sample comprising: a magnetic field source adapted to orient the spin of the nuclei in a sample; a detector capable of detecting a magnetic field comprising an oscillator; at least one conductor substantially surrounding the oscillator for forming a RF antenna for transmitting a radio frequency electromagnetic field; whereby the at least one conductor transmits a radio frequency electromagnetic field that influences the nuclei in the sample, and whereby the detector detects how the nuclei are influenced through the oscillations of the oscillator to provide identification information concerning the content of the sample. Also included is a method for magnetic resonance force microscopy of a sample.


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