The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Oct. 29, 2015
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Bernhard Forster, Finkenstein, AT;

Kirk Herfurth, Munich, DE;

Mihai Alexandru Ionescu, Villach, AT;

Friedrich Rasbornig, Klagenfurt, AT;

Christoph Schroers, Villach, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/088 (2013.01); G01R 31/007 (2013.01);
Abstract

A monitoring unit () for monitoring an integrity of a signal path () configured to receive an input signal () and further configured to provide an output () in response to the input signal (), comprises a signal monitor () configured to extract a first signal () from the signal path () corresponding to the input signal () in at least a first characteristic. The monitoring unit () further comprises a signal interface () configured to extract a second signal () corresponding to the output () in at least a second characteristic from the signal path (); and an evaluator () configured to determine, whether the at least first characteristic of the first signal () corresponds to the at least second characteristic of the second signal () according to a predefined relation.


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