The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Feb. 26, 2014
Applicants:

Bhyrav M. Mutnury, Round Rock, TX (US);

Sandor Farkas, Round Rock, TX (US);

Wallace H. Ables, Georgetown, TX (US);

Inventors:

Bhyrav M. Mutnury, Round Rock, TX (US);

Sandor Farkas, Round Rock, TX (US);

Wallace H. Ables, Georgetown, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/048 (2013.01);
Abstract

Methods and systems for monitoring contact joint integrity in an information handling system may include precisely monitoring a change in resistance of a resistive element associated with a contact joint. The change in resistance of the resistive element may be indicative of the integrity of the contact joint. The resistance may be measured using a modulated current source and by demodulating a voltage signal resulting from the modulated current flowing across the resistive element.


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