The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Aug. 29, 2014
Applicant:

Fujitsu Semiconductor Limited, Yokohama-shi, Kanagawa, JP;

Inventors:

Hiroo Mizuno, Kawasaki, JP;

Akira Shimamura, Yokohama, JP;

Takashi Arai, Machida, JP;

Assignee:

SOCIONEXT INC., Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 3/00 (2006.01); G01P 3/44 (2006.01); G01D 3/036 (2006.01); G01D 5/20 (2006.01);
U.S. Cl.
CPC ...
G01P 3/00 (2013.01); G01D 3/0365 (2013.01); G01P 3/44 (2013.01); G01D 5/2073 (2013.01);
Abstract

An angle detection device includes: first and second rotation measuring instruments; an anomaly detection unit detecting occurrences of anomalies in the first and second rotation measuring instruments; and a switching interpolation unit configured to select a first angle signal and a first angular speed signal and output as a third angle signal and a third angular speed signal when the first rotation measuring instrument is normal, and to perform switching so that a second angle signal and a second angular speed signal are output as the third angle signal and the third angular speed signal while performing interpolation so that the difference between the first angle signal and the second angle signal is reduced stepwise if the second rotation measuring instrument is normal when an anomaly has occurred in the first rotation measuring instrument.


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