The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2017
Filed:
May. 22, 2011
Applicants:
Hossam Haick, Haifa, IL;
Gregory Shuster, Ramat Ishay, IL;
Inventors:
Hossam Haick, Haifa, IL;
Gregory Shuster, Ramat Ishay, IL;
Assignee:
Technion Research & Development Foundation Ltd., Haifa, IL;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/497 (2006.01); B82Y 15/00 (2011.01); G01N 33/574 (2006.01); G01N 33/58 (2006.01);
U.S. Cl.
CPC ...
G01N 33/497 (2013.01); B82Y 15/00 (2013.01); G01N 33/57415 (2013.01); G01N 33/587 (2013.01); G01N 2033/4975 (2013.01); G01N 2800/50 (2013.01); G01N 2800/56 (2013.01);
Abstract
The present invention provides a method for detecting and grading benign and malignant tumors using at least one sensor of conductive nanoparticles capped with an organic coating in conjunction with a learning and pattern recognition algorithm. The method utilizes a plurality of response induced parameters to obtain improved sensitivity and selectivity for diagnosis, prognosis, monitoring and staging various types of cancers, or for identifying or grading benign or malignant tumors.