The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2017

Filed:

Oct. 12, 2012
Applicant:

Northwestern University, Evanston, IL (US);

Inventors:

Vadim Backman, Chicago, IL (US);

Ji Yi, Evanston, IL (US);

Assignee:

NORTHWESTERN UNIVERSITY, Evanston, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 21/47 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4795 (2013.01); A61B 5/0066 (2013.01);
Abstract

A method and system to measure and image the full optical scattering properties by inverse spectroscopic optical coherence tomography (ISOCT) is disclosed. Tissue is modeled as a medium with continuous refractive index (RI) fluctuation and such a fluctuation is described by the RI correlation functions. By measuring optical quantities of tissue (including the scattering power of the OCT spectrum, the reflection albedo α defined as the ratio of scattering coefficient μ, and the backscattering coefficient μ), the RI correlation function can be inversely deduced and the full set of optical scattering properties can be obtained.


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